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Description of the discipline General notions on probe methods for studying nanomaterials structure. Scanning tunnel microscopy. Atomic force microscopy. Electric force microscopy. Magnetic force microscopy. Near- field optic microscopy. Physic bases of scanning tunnel microscopy and atomic force microscopy. Principle of operation of a scanning tunnel microscope (STM). Tunneling. Equipment for STM. Measurement methods of STM. Physical operation principles of an atomic force microscope. Operating modes of an atomic force microscope: contact, contactless, semicontact. Physical bases of electric force (EFM), magnetic force (MFM) and near-field optical microscopy (NFOM). Physical bases of interaction between a probe and a sample in EFM. Equipment for NFOM. Operation principle of NFOM. Methods of NFOM. Configuration of NFOM.
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