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Гольдштейн Александр Ефремович
Доктор технических наук

Отделение контроля и диагностики, Профессор
Отделение контроля и диагностики, Инженер


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Date of birth: May, 03, 1954.

Place of birth: Ruzaevka, Mordovia ASSR, Russia.

Education: Higher education, graduated from Tomsk Polytechnic Institute, Automation and computer engineering Department with honors in 1976 and was awarded a qualification "engineer- electric" and specialty "information and measuring equipment".

Dissertation for the degree of doctor of technical sciences "The development of methods and means of eddy current testing based on the use of non-stationary on the direction magnetic fields" was defended in 2002 in the Tomsk Polytechnic Institute, Tomsk.

Career path:
1971-1976 - student of the Tomsk Polytechnic Institute 1976-1978 - engineer of Research Institute for electronic imaging of Tomsk Polytechnic Institute (TPI) 1978-1985 – junior research assistant of Research Institute for electronic imaging of TPI 1985-1986 – senior research assistant of Research Institute for electronic imaging of TPI 1986-1992 – head of laboratory of Research Institute for electronic imaging of TPI 2002-2006 – professor of Department of information-measuring devices of electro-physics faculty TPU 2006-2015 – head of Department of information-measuring devices of electro-physics faculty TPU Since 2015 – professor of Department of physical control methods of Institute of nondestructive testing TPU.

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